1. |
Опис. |
2016-Abhilash-Structural, thermal and dielectr |
2. |
Опис. |
2016-Fu-Microwave dielectric properties of low |
3. |
Опис. |
2016-Guo-Li2Zn2W2O9_ A novel low-temperature s |
4. |
Опис. |
2016-Kähäri-Room-temperature fabrication of mi |
5. |
Опис. |
2016-Lan-Phase transition and low-temperature |
6. |
Опис. |
2016-Li-Li 4 WO 5 _ A temperature stable low-f |
7. |
Опис. |
2016-Li-Structure and Microwave dielectric pro |
8. |
Опис. |
2016-Ma-Microwave dielectric properties of low |
9. |
Опис. |
2016-Pei-Low temperature sintering and microwa |
10. |
Опис. |
2016-Wang-A novel low-temperature fired microw |
11. |
Опис. |
2016-Wang-Structure and microwave dielectric p |
12. |
Опис. |
2016-Xiang-A Novel Temperature Stable Microwav |
13. |
Опис. |
2016-Xiang-Low-firing and microwave dielectric |
14. |
Опис. |
2016-Yanpeng-Low temperature sintering and mic |
15. |
Опис. |
2016-Yao-Microwave dielectric properties of lo |
16. |
Опис. |
2016-Zhang-Low temperature sintering and micro |
17. |
Опис. |
2016-Zhang-Microwave dielectric properties of |
18. |
Опис. |
2016-Zhou-Microwave dielectric properties of L |
19. |
Опис. |
2016-Zhou-Processing of low-fired glass-free L |
20. |
Опис. |
2017-Bi-Li4Mg3Ti2O9_ A novel low-loss microwav |
21. |
Опис. |
2017-Bian-Tape casting and characterization of |
22. |
Опис. |
2017-Chang-Microwave dielectric properties of |
23. |
Опис. |
2017-Chen-Low Temperature Sintering Kinetics a |
24. |
Опис. |
2017-Cheng-Microwave dielectric properties of |
25. |
Опис. |
2017-Du-High-Q microwave dielectric properties |
26. |
Опис. |
2017-Du-Phase evolution and microwave dielectr |
27. |
Опис. |
2017-Fu-Novel temperature stable Li 2 Mg 3 TiO |
28. |
Опис. |
2017-Gu-Effect of BaCu(B2O5) on the sintering |
29. |
Опис. |
2017-Hu-Novel low loss, low permittivity (1 − |
30. |
Опис. |
2017-Lai-Temperature stability and high-Qf of |
31. |
Опис. |
2017-Li-Microwave dielectric properties in the |
32. |
Опис. |
2017-Liu-Low temperature fired Ln2Zr3(MoO4)9 ( |
33. |
Опис. |
2017-Ma-Synthesis and microwave dielectric pro |
34. |
Опис. |
2017-Pan-Low temperature sintering and microwa |
35. |
Опис. |
2017-Pan-New Li3Ni2NbO6 microwave dielectric c |
36. |
Опис. |
2017-Ren-Sintering mechanism and microwave die |
37. |
Опис. |
2017-Song-Temperature-stable BaAl2Si2O8–Ba5Si8 |
38. |
Опис. |
2017-Unnimaya-Crystal structure and microwave |
39. |
Опис. |
2017-Wang-Microwave dielectric properties of B |
40. |
Опис. |
2017-Wang-Microwave dielectric properties of t |
41. |
Опис. |
2017-Weng-Effects of the Bi2O3-SiO2 addition o |
42. |
Опис. |
2017-Weng-Effects of the ZBS addition on the s |
43. |
Опис. |
2017-Xia-Microwave dielectric ceramic of LiZnP |
44. |
Опис. |
2017-Xiang-A novel low-firing microwave dielec |
45. |
Опис. |
2017-Xiang-Two novel ultralow temperature firi |
46. |
Опис. |
2017-Zhou-Compatibility with silver electrode |
47. |
Опис. |
2017-Zuo-Effects of BaCu(B2O5) addition on mic |
48. |
Опис. |
2017-Zuo-Low-dielectric-constant LiAlO 2 ceram |
49. |
Опис. |
2018-Chen-High dielectric constant and high-Q |
50. |
Опис. |
2018-Du-Effects of Li-ion substitution on the |
51. |
Опис. |
2018-Feng-Reducing-atmosphere resistant mechan |
52. |
Опис. |
2018-Hong-Low-Temperature Sintering and Microw |
53. |
Опис. |
2018-Li-Ultra-Low Loss Microwave Dielectric Ce |
54. |
Опис. |
2018-Liu-A novel Li2TiO3–Li2CeO3 ceramic compo |
55. |
Опис. |
2018-Liu-A novel low-temperature firable La2Zr |
56. |
Опис. |
2018-Liu-Crystallization behavior, densificati |
57. |
Опис. |
2018-Ren-Novel Al2Mo3O12-based temperature-sta |
58. |
Опис. |
2018-Ren-Sintering behavior and microwave diel |
59. |
Опис. |
2018-Tseng-Microwave dielectric properties of |
60. |
Опис. |
2018-Weng-Low temperature sintering and microw |
61. |
Опис. |
2018-Xiang-Ultralow Loss CaMgGeO4 Microwave Di |
62. |
Опис. |
2018-Yang-A new low-firing and high-Q microwav |
63. |
Опис. |
2018-Yang-Synthesis of Zn0 |
64. |
Опис. |
2018-Yin-Low‐temperature sintering and thermal |
65. |
Опис. |
2018-Zhang-A novel low loss and low temperatur |
66. |
Опис. |
2018-Zhang-The microwave dielectric properties |
67. |
Опис. |
2018-Zhou-Phase composition, singtering behavi |
68. |
Опис. |
2018-Zitani-High quality factor microwave diel |
69. |
Опис. |
2018-Zitani-Microstructural and microwave diel |
70. |
Опис. |
2018-Zuo-A new Li-based ceramic of Li4MgSn2O7_ |
71. |
Опис. |
2019-Fu-Low temperature sintering mechanism fo |
72. |
Опис. |
2019-Guo-Microwave dielectric properties of lo |
73. |
Опис. |
2019-Hsiang-Microwave dielectric properties of |
74. |
Опис. |
2019-Kai-Phase formation and microwave dielect |
75. |
Опис. |
2019-Lan-A novel low‐permittivity LiAl |
76. |
Опис. |
2019-Li-Crystal structure, microwave dielectri |
77. |
Опис. |
2019-Lu-Microwave dielectric properties of BaO |
78. |
Опис. |
2019-Ohsato-Micro_Millimeter-Wave Dielectric I |
79. |
Опис. |
2019-Ouyang-Sintering behavior and microwave p |
80. |
Опис. |
2019-Qi-Effects of Bi2O3–ZnO–B2O3–SiO2 glass a |
81. |
Опис. |
2019-Qin-Investigation on glass-forming abilit |
82. |
Опис. |
2019-Qin-Low-temperature sintering mechanism a |
83. |
Опис. |
2019-Qing-Sintering, Microstructure and Microw |
84. |
Опис. |
2019-Shu-Low-firing and microwave dielectric p |
85. |
Опис. |
2019-Song-Ultra‐low fired fluoride composite m |
86. |
Опис. |
2019-Zhang-Li5Ti2O6F_ a new low-loss oxyfluori |
87. |
Опис. |
2019-Zhang-Sintering behavior and microwave di |
88. |
Опис. |
2019-Zhang-Structural, infrared reflectivity s |
89. |
Опис. |
2019-Zheng-Sintering Behavior and Microwave Di |
90. |
Опис. |
2020-Bafrooei-Ca3MgSi2O8_ Novel low-permittivi |
91. |
Опис. |
2020-Feng-Sintering behavior and microwave die |
92. |
Опис. |
2020-Gu-Effect of Mg_B ratio and Sr2+ substitu |
93. |
Опис. |
2020-Hao-Structure, spectral analysis and micr |
94. |
Опис. |
2020-Hu-A new additive-free microwave dielectr |
95. |
Опис. |
2020-Huang-Low-temperature sintering and micro |
96. |
Опис. |
2020-Huang-Microwave dielectric properties of |
97. |
Опис. |
2020-Lv-Influence of CaO–B2O3–SiO2 crystalliza |
98. |
Опис. |
2020-Peng-High-performance microwave dielectri |
99. |
Опис. |
2020-Shi-Crystal structure, Raman spectroscopy |
100. |
Опис. |
2020-Shi-Effects of W6+ substitution on the mi |
101. |
Опис. |
2020-Su-Novel low-permittivity microwave diele |
102. |
Опис. |
2020-Wan-Improved mechanical and high-temperat |
103. |
Опис. |
2020-Yin-NaCa4V5O17_ A low-firing microwave di |
104. |
Опис. |
2020-Zhang-Influence of substituting Na+ for M |
105. |
Опис. |
2020-Zhang-Ultralow-loss and temperature-stabl |
106. |
Опис. |
2020-Zheng-Structure, infrared reflectivity sp |
107. |
Опис. |
2020-Zhong-Crystal structure and microwave die |
108. |
Опис. |
2020-Zhong-Microwave dielectric properties, mi |
109. |
Опис. |
2021-Chen-A low‐permittivity microwave dielect |
110. |
Опис. |
2021-Chen-Structure and chemical bond characte |
111. |
Опис. |
2021-Chu-A new high-Q×f Li4NbO4F microwave die |
112. |
Опис. |
2021-Deshmukh-Synthesis and Microwave Dielectr |
113. |
Опис. |
2021-Hu-BaMnV2O7:A novel microwave dielectric |
114. |
Опис. |
2021-Li-Enhancement of structural and microwav |
115. |
Опис. |
2021-Tang-Relationship between Rattling Mg2+ i |
116. |
Опис. |
2021-Tao-Low-temperature sintering LiF-doped L |
117. |
Опис. |
2021-Wang-Sintering behaviour and microwave di |
118. |
Опис. |
2021-Yang-Crystal structure, Raman spectra and |
119. |
Опис. |
2021-Yang-Synthesis of CaAl2B2O4+3_ Novel micr |
120. |
Опис. |
2021-Zhan-The simulation for a high-efficiency |
121. |
Опис. |
2021-Zhang-Microwave dielectric properties of a low firing |
122. |
Опис. |
2021-Zhang-Microwave dielectric properties of |
123. |
Опис. |
2021-Zhang-Sintering behavior and microwave di |